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3506-10
BIN function, for easy component screening
제품번호3506-10
제품명C METER
제품분류회로소자 측정기
제품상세정보
≫ Overview
• High-speed analog test time of 0.6 ms (at 1 MHz)
• Improved noise resistance and enhanced repeatability in measurement precision even for production lines
• 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
• BIN function, for easy component screening
• High-speed analog test time of 0.6 ms (at 1 MHz)
• Improved noise resistance and enhanced repeatability in measurement precision even for production lines
• 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
• BIN function, for easy component screening
≫ Specifications
